Cite
HARVARD Citation
Ngom, C. et al. (2021). Modelling of charge injection by multi-photon absorption in GaN-on-Si HEMTs for SEE testing. Microelectronics and reliability. p. . [Online].
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Ngom, C. et al. (2021). Modelling of charge injection by multi-photon absorption in GaN-on-Si HEMTs for SEE testing. Microelectronics and reliability. p. . [Online].