Cite
HARVARD Citation
Coelho, C. et al. (2021). Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices. Microelectronics journal. p. . [Online].
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Coelho, C. et al. (2021). Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices. Microelectronics journal. p. . [Online].