Breaking the Fundamental Limitations of Nanoscale Ferroelectric Characterization: Non‐Contact Heterodyne Electrostrain Force Microscopy (Small Methods 11/2021). Issue 11 (12th November 2021)

• Record Type: Journal Article
• Authors: Zeng, Qibin; Huang, Qicheng; Wang, Hongli; Li, Caiwen; Fan, Zhen; Chen, Deyang; Cheng, Yuan; Zeng, Kaiyang
• Is Part Of: Small methods. Volume 5:Issue 11(2021)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2021-11-12
• Subjects: electrostrain -- ferroelectric -- non‐contact ferroelectric characterization -- piezoelectric -- piezoresponse force microscopy -- quartz tuning fork; Nanotechnology -- Methodology -- Periodicals; Nanotechnology -- Periodicals; Periodicals; 620.5028
• DOI: 10.1002/smtd.202170055
• Languages: English
• ISSNs: 2366-9608

Abstract

Abstract : Inside Front Cover In article number 2100639, Zeng and co‐workers have developed a new SPM technique for nanoscale ferroelectric characterization, namely non‐contact heterodyne electrostrain force microscopy (NC‐HEsFM). NC‐HEsFM breaks the fundamental limitations of the conventionally used piezoresponse force microscopy method by providing a brand‐new non‐contact yet non‐destructive, high‐resolution, non‐optical, electrostatic force effect‐eliminated, highly extreme environments compatible, and multi‐functional ferroelectric characterization solution.