Cite
HARVARD Citation
Semeraro, C. et al. (2021). Pattern-based Digital Twin for Optimizing Manufacturing Systems: A Real Industrial-Case Application. IFAC-PapersOnLine. 54 (1), pp. 307-312. [Online].
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Semeraro, C. et al. (2021). Pattern-based Digital Twin for Optimizing Manufacturing Systems: A Real Industrial-Case Application. IFAC-PapersOnLine. 54 (1), pp. 307-312. [Online].