Cite
HARVARD Citation
Dong, Q. et al. (2021). Modelling technical compromises in electronics manufacturing with BPMN+TD – an industrial use case. IFAC-PapersOnLine. 54 (1), pp. 912-917. [Online].
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Dong, Q. et al. (2021). Modelling technical compromises in electronics manufacturing with BPMN+TD – an industrial use case. IFAC-PapersOnLine. 54 (1), pp. 912-917. [Online].