Cite
HARVARD Citation
Upadhyay, M. et al. (2021). Thickness dependence of dielectric properties in sub-nanometric Al2O3/ZnO laminates. Solid-state electronics. p. . [Online].
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Upadhyay, M. et al. (2021). Thickness dependence of dielectric properties in sub-nanometric Al2O3/ZnO laminates. Solid-state electronics. p. . [Online].