Business Intelligence for Product Defect Analysis. (August 2019)
- Record Type:
- Journal Article
- Title:
- Business Intelligence for Product Defect Analysis. (August 2019)
- Main Title:
- Business Intelligence for Product Defect Analysis
- Authors:
- Girsang, A S
Isa, S M
Haris, A L
Arwan,
Mandagie, K
Ariana, L R
Ardinda, V - Abstract:
- Abstract: The problem of reporting service in PT.XYZ is the complexity of the query to take the data from the table in oracle. There are many table to be processed for the data, because of that it's hard to show the report quickly. PT XYZ needs fast and reliable report to be shown, especially for control or audit. The suggested solution is to use data warehouse, because it has more structured storage and the data can be analysed by OLAP analysis that has the capability to show the data quickly. Data warehouse development was done through nine step that has been designed by Kimball and Ross. With this solution, PT XYZ has the capability to maintain quality of the product by monitoring the process and the data.
- Is Part Of:
- IOP conference series. Volume 598(2019)
- Journal:
- IOP conference series
- Issue:
- Volume 598(2019)
- Issue Display:
- Volume 598, Issue 2019 (2019)
- Year:
- 2019
- Volume:
- 598
- Issue:
- 2019
- Issue Sort Value:
- 2019-0598-2019-0000
- Page Start:
- Page End:
- Publication Date:
- 2019-08
- Subjects:
- Materials science -- Periodicals
620.1105 - Journal URLs:
- http://iopscience.iop.org/1757-899X ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1757-899X/598/1/012117 ↗
- Languages:
- English
- ISSNs:
- 1757-8981
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 19581.xml