Cite
HARVARD Citation
Liu, C. et al. (2021). Effects of oxygen flow ratio and thermal annealing on defect evolution of aluminum doped zinc oxide thin films by reactive DC magnetron sputtering. Journal of physics. p. . [Online].
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Liu, C. et al. (2021). Effects of oxygen flow ratio and thermal annealing on defect evolution of aluminum doped zinc oxide thin films by reactive DC magnetron sputtering. Journal of physics. p. . [Online].