Opposed-view spatially multiplexed interferometric microscopy. (31st January 2019)

• Record Type: Journal Article
• Authors: Picazo-Bueno, José Ángel; Micó, Vicente
• Is Part Of: Journal of optics. Volume 21:Number 3(2019)
• Publication Date: 2019-01-31
• Subjects: multiplexed holography -- digital image processing -- digital holographic microscopy -- reflective im; Optics -- Periodicals; 535.05
• DOI: 10.1088/2040-8986/ab000e
• Languages: English
• ISSNs: 2040-8978

Abstract

Abstract: The capability for simultaneous recording of light which is transmitted and reflected by a sample has big potential in microscopy. In this paper, we introduce opposed-view spatially multiplexed interferometric microscopy (OV-SMIM) as the combination of transmission and reflection (transflective) imaging modalities into a digital holographic microscopy platform. The implementation is in virtue of wavelength multiplexing for allowing simultaneous retrieval of quantitative phase information of the inspected sample. OV-SMIM generalizes a SMIM concept and provides an extremely simple, low cost and highly stable way to convert a bright field microscope into a holographic one with the functionality of transflective imaging. Experimental validation is presented for a regular Olympus BX-60 upright microscope considering chromium coated patterns and microbeads.