Spherical indexing of overlap EBSD patterns for orientation-related phases – Application to titanium. (15th April 2020)

• Record Type: Journal Article
• Authors: Lenthe, W.C.; Germain, L.; Chini, M.R.; Gey, N.; De Graef, M.
• Is Part Of: Acta materialia. Volume 188(2020)
• Page Start: 579
• Page End: 590
• Publication Date: 2020-04-15
• Subjects: EBSD -- indexing -- Titanium -- orientation relationship -- parent phase determination; Materials -- Periodicals; Materials science -- Periodicals; Materials -- Mechanical properties -- Periodicals; Metallurgy -- Periodicals; Chemistry, Inorganic -- Periodicals; 620.112
• DOI: 10.1016/j.actamat.2020.02.025
• Languages: English
• ISSNs: 1359-6454

Abstract

Graphical abstract: Abstract: We propose a new electron backscatter diffraction (EBSD) indexing approach that can handle overlapping patterns arising from fine-scale mixtures of two crystallographically distinct but related phases. The approach relies on a combination of spherical indexing (SI) with an overlap master pattern (OMP) in which the two phases have the proper orientation relation. We illustrate the approach using a Ti-10-2-3 sample and compare results from traditional Hough-based indexing of the α and β -phases with SI maps. We show that the SI approach produces superior orientation maps, and we present a symmetry-based algorithm for the determination of the α -phase variant when experimental patterns are indexed with respect to the OMP. We illustrate the use of the OMP to determine the parent β -phase volume fraction and obtain excellent agreement with Thermo-Calc phase fraction predictions.