Cite
HARVARD Citation
Yu, J. et al. (2021). Wafer map defect recognition based on deep transfer learning-based densely connected convolutional network and deep forest. Engineering applications of artificial intelligence. p. . [Online].
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Yu, J. et al. (2021). Wafer map defect recognition based on deep transfer learning-based densely connected convolutional network and deep forest. Engineering applications of artificial intelligence. p. . [Online].