Cite
HARVARD Citation
Tala-Ighil, B. et al. (2015). Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET. Microelectronics and reliability. 55 (9), pp. 1512-1516. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Tala-Ighil, B. et al. (2015). Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET. Microelectronics and reliability. 55 (9), pp. 1512-1516. [Online].