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HARVARD Citation
Petitdidier, S. et al. (2015). Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs. Microelectronics and reliability. 55 (9), pp. 1719-1723. [Online].
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Petitdidier, S. et al. (2015). Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs. Microelectronics and reliability. 55 (9), pp. 1719-1723. [Online].