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HARVARD Citation
Ruffilli, R. et al. (2015). In-depth investigation of metallization aging in power MOSFETs. Microelectronics and reliability. 55 (9), pp. 1966-1970. [Online].
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Ruffilli, R. et al. (2015). In-depth investigation of metallization aging in power MOSFETs. Microelectronics and reliability. 55 (9), pp. 1966-1970. [Online].