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HARVARD Citation
Welter, L. et al. (2015). Improvement of MOSFET matching characterization with calibrated multiplexed test structure. Microelectronics and reliability. 55 (9), pp. 1328-1333. [Online].
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Welter, L. et al. (2015). Improvement of MOSFET matching characterization with calibrated multiplexed test structure. Microelectronics and reliability. 55 (9), pp. 1328-1333. [Online].