Cite
HARVARD Citation
Ricci, E. et al. (2015). TEM sample preparation of a SEM cross section using electron beam induced deposition of carbon. Microelectronics and reliability. 55 (9), pp. 2126-2130. [Online].
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Ricci, E. et al. (2015). TEM sample preparation of a SEM cross section using electron beam induced deposition of carbon. Microelectronics and reliability. 55 (9), pp. 2126-2130. [Online].