Work-related fatigue among workers on semiconductor manufacturing lines. (19th October 2011)
- Record Type:
- Journal Article
- Title:
- Work-related fatigue among workers on semiconductor manufacturing lines. (19th October 2011)
- Main Title:
- Work-related fatigue among workers on semiconductor manufacturing lines
- Authors:
- Lin, Yu-Cheng
Chen, Pau-Chung - Abstract:
- Abstract : Objectives: To examine potential risk factors for work-related fatigue among the apparently healthy workers on semiconductors production lines. Methods: The data, including general health check-up records, need for recovery after work (NFR) scale questionnaires, personal and occupational history, were analyzed for 1545 on-site workers (1117 males, 428 females; mean age 37.6 years). The high-NFR (h-NFR) workers, whose NFR scores were within the top quartile, were defined as workers suffering from work-related fatigue. Results: Comparing to the regular daytime workers, the workers with current but not persistent exposure to shiftwork had a 4.0-fold (95% CI, 2.7 to 5.9) increased risk of h-NFR, higher than the 2.2-fold (95% CI 1.5 to 3.3) elevated risk of h-NFR for persistent shift workers and the 2.1-fold (95% CI 1.4 to 3.2) for workers with prior exposures to shiftwork. The male employees with university attainments had an odd ratio (OR) of 2.8 (95% CI 1.0 to 7.8) for h-NFR, comparing to the male employees having simply mandatory education. For female workers, currently married/cohabiting status inversely associated with h-NFR (OR 0.5; 95% CI 0.2 to 0.9); and child-raising moderately increased risk for h-NFR (OR 1.9; 95% CI 1.0 to 3.7). Conclusions: Among semiconductor manufacturing on-site workers, shiftwork is a major risk factor for work-related fatigue, especially for the employees are adapting to shift schedules. In terms of gender differences, male on-siteAbstract : Objectives: To examine potential risk factors for work-related fatigue among the apparently healthy workers on semiconductors production lines. Methods: The data, including general health check-up records, need for recovery after work (NFR) scale questionnaires, personal and occupational history, were analyzed for 1545 on-site workers (1117 males, 428 females; mean age 37.6 years). The high-NFR (h-NFR) workers, whose NFR scores were within the top quartile, were defined as workers suffering from work-related fatigue. Results: Comparing to the regular daytime workers, the workers with current but not persistent exposure to shiftwork had a 4.0-fold (95% CI, 2.7 to 5.9) increased risk of h-NFR, higher than the 2.2-fold (95% CI 1.5 to 3.3) elevated risk of h-NFR for persistent shift workers and the 2.1-fold (95% CI 1.4 to 3.2) for workers with prior exposures to shiftwork. The male employees with university attainments had an odd ratio (OR) of 2.8 (95% CI 1.0 to 7.8) for h-NFR, comparing to the male employees having simply mandatory education. For female workers, currently married/cohabiting status inversely associated with h-NFR (OR 0.5; 95% CI 0.2 to 0.9); and child-raising moderately increased risk for h-NFR (OR 1.9; 95% CI 1.0 to 3.7). Conclusions: Among semiconductor manufacturing on-site workers, shiftwork is a major risk factor for work-related fatigue, especially for the employees are adapting to shift schedules. In terms of gender differences, male on-site workers with the higher educational attainment are at the higher risk for work-related fatigue; domestic factors significantly affect female on-site workers in the recovery from work-related fatigue. … (more)
- Is Part Of:
- Occupational and environmental medicine. Volume 68(2011)Supplement 1
- Journal:
- Occupational and environmental medicine
- Issue:
- Volume 68(2011)Supplement 1
- Issue Display:
- Volume 68, Issue 1 (2011)
- Year:
- 2011
- Volume:
- 68
- Issue:
- 1
- Issue Sort Value:
- 2011-0068-0001-0000
- Page Start:
- A127
- Page End:
- A127
- Publication Date:
- 2011-10-19
- Subjects:
- Medicine, Industrial -- Periodicals
Environmental health -- Periodicals
616.980305 - Journal URLs:
- http://oem.bmj.com/ ↗
http://www.jstor.org/journals/13510711.html ↗
http://www.pubmedcentral.nih.gov/tocrender.fcgi?journal=172&action=archive ↗
http://www.bmj.com/archive ↗ - DOI:
- 10.1136/oemed-2011-100382.423 ↗
- Languages:
- English
- ISSNs:
- 1351-0711
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
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- 19197.xml