Cite
HARVARD Citation
Raj, R. et al. (2021). Effect of active layer thickness variation on scaling response in a-IGZO thin film transistors under Schottky limited operation. Semiconductor science and technology. p. . [Online].
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Raj, R. et al. (2021). Effect of active layer thickness variation on scaling response in a-IGZO thin film transistors under Schottky limited operation. Semiconductor science and technology. p. . [Online].