Cite
HARVARD Citation
Huo, J. et al. (2021). Investigation on negative capacitance FinEFT beyond 7 nm node from device to circuit. Microelectronics journal. p. . [Online].
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Huo, J. et al. (2021). Investigation on negative capacitance FinEFT beyond 7 nm node from device to circuit. Microelectronics journal. p. . [Online].