Cite
HARVARD Citation
Patmanidis, K. et al. (2021). Configurable gate driver for a stress test bench of newly developed discrete silicon power devices. Microelectronics and reliability. p. . [Online].
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Patmanidis, K. et al. (2021). Configurable gate driver for a stress test bench of newly developed discrete silicon power devices. Microelectronics and reliability. p. . [Online].