Cite
HARVARD Citation
Liu, B. et al. (2021). Prediction of IGBT junction temperature using improved cuckoo search-based extreme learning machine. Microelectronics and reliability. p. . [Online].
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Liu, B. et al. (2021). Prediction of IGBT junction temperature using improved cuckoo search-based extreme learning machine. Microelectronics and reliability. p. . [Online].