Ultra-low power and reliable magnetic based interconnects for nano-scale technologies. (August 2019)

• Record Type: Journal Article
• Authors: Jamshidi, Vahid; Fazeli, Mahdi
• Is Part Of: Microelectronics journal. Volume 90(2019)
• Page Start: 39
• Page End: 47
• Publication Date: 2019-08
• Subjects: Magnetic tunnel junction (MTJ) -- Spintronic logic devices -- Low-power design -- Interconnect -- Reliability; Microelectronics -- Periodicals; Microélectronique -- Périodiques; Microelectronics; Electronic journals; Journals - contents and abstracts; Periodicals; 621.3805
• DOI: 10.1016/j.mejo.2019.05.011
• Languages: English
• ISSNs: 0959-8324

Abstract

Abstract: As technology shrinks toward nanometer scales, the delay and power consumption in logic gates reduces, while they follow an increasing trend in global interconnects. Consequently, on-chip interconnects have become a bottleneck from delay and power consumption points of view. In addition, due to reduced distance between adjacent wires in Nano-Scale technology, the effect of crosstalk noise has brought serious reliability challenges. In this paper, we propose an ultra-low power and reliable interconnect using magnetic based Driver-Receiver circuits and current mode signaling. The simulation results for 22-nm technology through comparison with the previous work shows significant superiority of the proposed interconnect considering delay, power consumption, and crosstalk robustness.