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HARVARD Citation
Garg, A. et al. (2019). Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation. Microelectronics journal. pp. 29-38. [Online].
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Garg, A. et al. (2019). Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation. Microelectronics journal. pp. 29-38. [Online].