Cite
HARVARD Citation
Kilani, D. et al. (2019). Cascaded power management unit characterization for TEG-based IoT devices in 65 nm CMOS. Microelectronics journal. pp. 285-296. [Online].
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Kilani, D. et al. (2019). Cascaded power management unit characterization for TEG-based IoT devices in 65 nm CMOS. Microelectronics journal. pp. 285-296. [Online].