6.5: Highly reliable 1W 638nm Laser Diode. (26th August 2021)

• Record Type: Journal Article
• Authors: Guo, Qiankun; Liu, Wenbin; Hu, Martin; Wang, Weimin; Wu, Shujuan; Li, Chengpeng
• Is Part Of: Digest of technical papers. Volume 52(2021)Supplement 2
• Page Start: 124
• Page End: 125
• Publication Date: 2021-08-26
• Subjects: Semiconductor laser -- Red laser -- GaInP -- AlGaInP -- reliability -- long-term aging; Information display systems -- Congresses; 621.3815422
• DOI: 10.1002/sdtp.15037
• Languages: English
• ISSNs: 0097-966X

Abstract

Abstract : We report the reliability test of tensile‐strained GaInP quantum‐well single‐emitter lasers of 638‐nm wavelength for RGB laser projection. P‐side‐down submounted multimode lasers with 110 μm stripe width were subjected to long‐term aging tests at the CW current of 1.5 A and the heat sink temperature of 25 Celsius. Except failures caused by current over‐surging, no devices have failed during the long‐term aging tests. The longest test has accumulated 22297.7 hours and the power degrading coefficient is approximately 3%/10000 hours.