Cite
HARVARD Citation
Chandrashekhar, S. et al. (2020). Radiation induced soft errors in 16 nm floating gate SLC NAND flash memory. Microelectronics and reliability. p. . [Online].
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Chandrashekhar, S. et al. (2020). Radiation induced soft errors in 16 nm floating gate SLC NAND flash memory. Microelectronics and reliability. p. . [Online].