Cite
HARVARD Citation
Zheng, Z. et al. (2021). A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions. Expert systems with applications. p. . [Online].
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Zheng, Z. et al. (2021). A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions. Expert systems with applications. p. . [Online].