Cite
HARVARD Citation
Gou, B. et al. (2021). Cracking mechanism and degradation performances of HTV silicone rubber with interfacial defects under acid and thermal stress. Engineering failure analysis. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Gou, B. et al. (2021). Cracking mechanism and degradation performances of HTV silicone rubber with interfacial defects under acid and thermal stress. Engineering failure analysis. p. . [Online].