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HARVARD Citation
Usui, K. et al. (n.d.). Electronic structure of Ti1−xFexO2−δ thin films with oxygen vacancies probed by soft X-ray spectroscopy. Japanese journal of applied physics. p. . [Online].
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Usui, K. et al. (n.d.). Electronic structure of Ti1−xFexO2−δ thin films with oxygen vacancies probed by soft X-ray spectroscopy. Japanese journal of applied physics. p. . [Online].