A reliability assessment approach for a Hodgkin-Huxley neuron circuit. (June 2021) - Sun, Bo
Abstract: The performance of the Hodgkin-Huxley neuron circuits used in novel communication and computer systems depends on its capacitors. Thus, degradation of capacitors in neuron circuits may have significant impact on reliability of the neuron. In this paper, a simulation-based reliability assessment approach was developed for a Hodgkin-Huxley neuron circuit to consider the degradation of capacitors. SPICE simulation, neural information coding method, and degradation modelling of capacitors are integrated to assess impact of capacitors on the given neuron circuit. A MOS-based Hodgkin-Huxley neuron circuit is simulated to obtain output waveforms with degraded capacitors. It has been found that the output waveform of the selected neuron changes significantly with capacitors' degradation. In the total operation range of the neuron, degradation of capacitors may result in significant errors and loss of neural information. Capacitor's degradation elevates the duty ratio threshold for generating voltage spikes, and would lead to higher values of the inter-spike interval, regardless of variation of input period and duty cycle. However, by limitation of the input range and duty ration, information carried by S-Space code is transmitted correctly. Highlights: A reliability assessment approach for a Hodgkin-Huxley neuron circuit with consideration of capacitor degradation. Degradations of capacitor may shift operation point of the neuron, resulting in significant errors. Capacitor's degradation elevates the duty ratio threshold and inter-spike intervals of the neuron circuit. In the limited input range, errors caused by capacitor degradation can be corrected by the S-Space code.