Use of Full-Field X- ray Imaging and Ptychographic X-ray Computed Tomography for the Investigation of 3D Morphology of Micro-Nano Silver Materials for Advanced Electronics Packaging Applications. (August 2021) - Lin, Yu-Chung; Liu, Xiaoyang; Chou, Kang-wei; Tsai, Esther H. R.; Zhao, Chonghang; Holler, Mirko; Diaz, Ana; Petrash, Stanislas; Chen-Wiegart, Yu-chen Karen; Lee, Wah-Keat