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HARVARD Citation
Denninger, P. et al. (2021). In situ chip-based heating studies of metal-induced layer exchange and Si crystallization using STEM, LEND and SE imaging in SEM. Microscopy and microanalysis. pp. 2696-2698. [Online].
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Denninger, P. et al. (2021). In situ chip-based heating studies of metal-induced layer exchange and Si crystallization using STEM, LEND and SE imaging in SEM. Microscopy and microanalysis. pp. 2696-2698. [Online].