Improved Focused Ion Beam Sample Preparation Techniques for Transmission Electron Microscopy and Failure Analysis of Memristor Devices. (August 2021)

Record Type:: Journal Article
Title:: Improved Focused Ion Beam Sample Preparation Techniques for Transmission Electron Microscopy and Failure Analysis of Memristor Devices. (August 2021)
Main Title:: Improved Focused Ion Beam Sample Preparation Techniques for Transmission Electron Microscopy and Failure Analysis of Memristor Devices
Authors:: Athey, Benson
Mahalingam, Krishnamurthy
Ganguli, Sabyasachi
Hilton, Albert
Dhall, Rohan
Abstract:
Is Part Of:: Microscopy and microanalysis. Volume 27:Supplement 1(2021)
Journal:: Microscopy and microanalysis
Issue:: Volume 27:Supplement 1(2021)
Issue Display:: Volume 27, Issue 1 (2021)
Year:: 2021
Volume:: 27
Issue:: 1
Issue Sort Value:: 2021-0027-0001-0000
Page Start:: 436
Page End:: 437
Publication Date:: 2021-08
Subjects:: Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:: https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:: 10.1017/S1431927621002063 ↗
Languages:: English
ISSNs:: 1431-9276
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 18023.xml