Cite
HARVARD Citation
Schwalb, C. et al. (2021). In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB. Microscopy and microanalysis. p. 1020. [Online].
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Schwalb, C. et al. (2021). In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB. Microscopy and microanalysis. p. 1020. [Online].