Cite
HARVARD Citation
Lee, C. et al. (2021). Probing the Strain Fields of Single-Atom Defects in 2D materials with Sub-Picometer Precision. Microscopy and microanalysis. p. 1944. [Online].
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Lee, C. et al. (2021). Probing the Strain Fields of Single-Atom Defects in 2D materials with Sub-Picometer Precision. Microscopy and microanalysis. p. 1944. [Online].