Probing the Strain Fields of Single-Atom Defects in 2D materials with Sub-Picometer Precision. (August 2021) - Lee, Chia-Hao; Khan, Abid; Luo, Di; Santos, Tatiane; Shi, Chuqiao; Janicek, Blanka; Kang, Sangmin; Sobh, Nahil; Zhu, Wenjuan; Schleife, André; Clark, Bryan; Huang, Pinshane