Cite
HARVARD Citation
Chen, J. et al. (2021). A Quantitative Method for In-Situ Pump-Beam Metrology in Ultrafast Electron Microscopy. Microscopy and microanalysis. pp. 3416-3418. [Online].
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Chen, J. et al. (2021). A Quantitative Method for In-Situ Pump-Beam Metrology in Ultrafast Electron Microscopy. Microscopy and microanalysis. pp. 3416-3418. [Online].