Aberration Measurement and Correction in Scanning Transmission Electron Microscopy using Machine Learning. (August 2021)

Record Type:: Journal Article
Title:: Aberration Measurement and Correction in Scanning Transmission Electron Microscopy using Machine Learning. (August 2021)
Main Title:: Aberration Measurement and Correction in Scanning Transmission Electron Microscopy using Machine Learning
Authors:: Sagawa, Ryusuke
Uematsu, Fuminori
Aibara, Keito
Nakamichi, Tomohiro
Morishita, Shigeyuki
Abstract:
Is Part Of:: Microscopy and microanalysis. Volume 27:Supplement 1(2021)
Journal:: Microscopy and microanalysis
Issue:: Volume 27:Supplement 1(2021)
Issue Display:: Volume 27, Issue 1 (2021)
Year:: 2021
Volume:: 27
Issue:: 1
Issue Sort Value:: 2021-0027-0001-0000
Page Start:: 814
Page End:: 816
Publication Date:: 2021-08
Subjects:: Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:: https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:: 10.1017/S1431927621003226 ↗
Languages:: English
ISSNs:: 1431-9276
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 18021.xml