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HARVARD Citation
Sharma, C. et al. (2019). Investigation of the degradations in power GaN-on-Si MIS-HEMTs subjected to cumulative γ-ray irradiation. Microelectronics and reliability. p. . [Online].
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Sharma, C. et al. (2019). Investigation of the degradations in power GaN-on-Si MIS-HEMTs subjected to cumulative γ-ray irradiation. Microelectronics and reliability. p. . [Online].