Cite
HARVARD Citation
Marcello, G. et al. (2019). LVI-based failure analysis after PRBS defect activation: Two cases study. Microelectronics and reliability. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Marcello, G. et al. (2019). LVI-based failure analysis after PRBS defect activation: Two cases study. Microelectronics and reliability. p. . [Online].