Cite
HARVARD Citation
Ceccarelli, L. et al. (2019). Evaluating IGBT temperature evolution during short circuit operations using a TSEP-based method. Microelectronics and reliability. p. . [Online].
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Ceccarelli, L. et al. (2019). Evaluating IGBT temperature evolution during short circuit operations using a TSEP-based method. Microelectronics and reliability. p. . [Online].