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HARVARD Citation
Oliveira, I. et al. (2019). Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs. Microelectronics and reliability. p. . [Online].
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Oliveira, I. et al. (2019). Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs. Microelectronics and reliability. p. . [Online].