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HARVARD Citation
Ceccarelli, L. et al. (2019). Impact of device aging in the compact electro-thermal modeling of SiC power MOSFETs. Microelectronics and reliability. p. . [Online].
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Ceccarelli, L. et al. (2019). Impact of device aging in the compact electro-thermal modeling of SiC power MOSFETs. Microelectronics and reliability. p. . [Online].