Cite
HARVARD Citation
Palanisamy, S. et al. (2019). Investigation of the avalanche ruggedness of SiC MPS diodes under repetitive unclamped-inductive-switching stress. Microelectronics and reliability. p. . [Online].
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Palanisamy, S. et al. (2019). Investigation of the avalanche ruggedness of SiC MPS diodes under repetitive unclamped-inductive-switching stress. Microelectronics and reliability. p. . [Online].