Cite
HARVARD Citation
Bai, K. et al. (2021). Effect of high- and low-side blocking on short-circuit characteristics of SiC MOSFET. Microelectronics and reliability. p. . [Online].
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Bai, K. et al. (2021). Effect of high- and low-side blocking on short-circuit characteristics of SiC MOSFET. Microelectronics and reliability. p. . [Online].