Multicenter‐Bond‐Based Quantum Interference in Charge Transport Through Single‐Molecule Carborane Junctions. Issue 31 (27th June 2019)

• Record Type: Journal Article
• Authors: Tang, Chun; Chen, Lijue; Zhang, Longyi; Chen, Zhixin; Li, Guopeng; Yan, Zhewei; Lin, Luchun; Liu, Junyang; Huang, Longfeng; Ye, Yiling; Hua, Yuhui; Shi, Jia; Xia, Haiping; Hong, Wenjing
• Is Part Of: Angewandte Chemie international edition. Volume 58:Issue 31(2019)
• Page Start: 10601
• Page End: 10605
• Publication Date: 2019-06-27
• Subjects: carboranes -- conducting materials -- electron transport -- molecular electronics -- single-molecule studies; Chemistry -- Periodicals; 540
• DOI: 10.1002/anie.201904521
• Languages: English
• ISSNs: 1433-7851

Abstract

Abstract: Molecular components are vital to introduce and manipulate quantum interference (QI) in charge transport through molecular electronic devices. Up to now, the functional molecular units that show QI are mostly found in conventional π‐ and σ‐bond‐based systems; it is thus intriguing to study QI in multicenter bonding systems without both π‐ and σ‐conjugations. Now the presence of QI in multicenter‐bond‐based systems is demonstrated for the first time, through the single‐molecule conductance investigation of carborane junctions. We find that all the three connectivities in carborane frameworks show different levels of destructive QI, which leads to highly suppressed single‐molecule conductance in para‐ and meta‐connected carboranes. The investigation of QI into carboranes provides a promising platform to fabricate molecular electronic devices based on multicenter bonds. Abstract : Destructive quantum interference has been demonstrated in charge transport through multicenter‐bond‐based single‐molecule carborane junctions in which all three connectivities of the carborane framework show destructive quantum interference. The transmission channels in meta ‐connected carborane are comprehensively suppressed by destructive quantum interference, leading to highly insulating molecular junctions.