Cite
HARVARD Citation
Pawlak, M. et al. (n.d.). Quantitative thermal wave phase imaging of an IR semi-transparent GaAs wafer using IR lock-in thermography. Measurement science & technology. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Pawlak, M. et al. (n.d.). Quantitative thermal wave phase imaging of an IR semi-transparent GaAs wafer using IR lock-in thermography. Measurement science & technology. p. . [Online].