High‐Speed Atomic Force Microscopy: Large‐Range HS‐AFM Imaging of DNA Self‐Assembly through In Situ Data‐Driven Control (Small Methods 7/2019). Issue 7 (8th July 2019)

• Record Type: Journal Article
• Authors: Nievergelt, Adrian P.; Kammer, Christoph; Brillard, Charlène; Kurisinkal, Eva; Bastings, Maartje M. C.; Karimi, Alireza; Fantner, Georg E.
• Is Part Of: Small methods. Volume 3:Issue 7(2019)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2019-07-08
• Subjects: control system design -- DNA nanotechnology -- high‐speed atomic force microscopy -- resonance compensation -- self‐assembly; Nanotechnology -- Methodology -- Periodicals; Nanotechnology -- Periodicals; Periodicals; 620.5028
• DOI: 10.1002/smtd.201970022
• Languages: English
• ISSNs: 2366-9608

Abstract

Abstract : In article number 1900031 by Georg E. Fantner and co‐workers, a robust controller design in atomic force microscopy, relying on optimization and experimental data, is able to identify and correct the resonances that appear when imaging at high speed, even in a liquid environment. This technology is used to record in real time the self‐assembly of blunt‐end DNA tripods into large hexagonal lattices.