Development of a high-sensitivity dual-axis optoelectronic level using double-layer liquid refraction. (November 2021)

• Record Type: Journal Article
• Authors: Li, Ruijun; Ma, Shaohua; Xu, Peng; Pan, Qiaosheng; Wei, Yongqing; Fan, Kuang-Chao
• Is Part Of: Optics and lasers in engineering. Volume 146(2021)
• Publication Date: 2021-11
• Subjects: Dual-axis optoelectronic level -- Tilt sensor -- Autocollimator -- Angle measurement; Lasers in engineering -- Periodicals; Optical measurements -- Periodicals; Optics -- Periodicals; Lasers en ingénierie -- Périodiques; Mesures optiques -- Périodiques; Optique -- Périodiques; 621.36605
• DOI: 10.1016/j.optlaseng.2021.106696
• Languages: English
• ISSNs: 0143-8166

Abstract

Highlights: A refraction dual-axis optoelectronic level which could detect the dual-axis tilt angle is proposed and the mathematical model of the level is established. A double-layer liquid refraction principle is used to improve the level's sensitivity. The parallel-light paths are adopted to avoid interference from reflected light. The dual-axis optoelectronic level is designed and tested. Abstract: To satisfy the requirements of precision angle measurement and machine leveling, a high-sensitivity dual-axis optoelectronic level using double-layer liquid refraction is proposed in this paper. Silicone oil, with a constant horizontal surface, is used as a reference. A double-layer liquid refraction principle is used to improve the level's sensitivity. An autocollimator is used as a detector of two-dimensional angle. Parallel-light paths are adopted to avoid interference from reflected light. When the level has a tilt angle, the light spot on the quadrant photodiode of the autocollimator is bound to shift. The sensitivity model of the level was established, and the level was designed and tested. Experimental results revealed that the level has a resolution of 0.05 arcsec, a range of ± 150 arcsec, a repeatability of 0.4 arcsec, and a stability of ± 0.2 arcsec. It can be used to measure tilt with a high-precision requirement.