Cite
HARVARD Citation
Izmailov, R. et al. (2021). Electron trapping in ferroelectric HfZrO4 and Al- and Si-doped layers. Solid-state electronics. p. . [Online].
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Izmailov, R. et al. (2021). Electron trapping in ferroelectric HfZrO4 and Al- and Si-doped layers. Solid-state electronics. p. . [Online].